SN74BCT8244ADW Part Information

Details for SN74BCT8244ADW by Texas Instruments

Electronic & Electrical Components>Semiconductors - ICs>Logic

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Part Specifications

Logic Type Scan Test Device
Logic Case Style SOIC
No. of Pins 24Pins
Supply Voltage Min 4.5V
Supply Voltage Max 5.5V
Operating Temperature Min 0°C
Operating Temperature Max 70°C
Product Range -
RoHS Phthalates Compliant Yes
MSL MSL 1 - Unlimited
SVHC No SVHC (27-Jun-2018)
Logic Function Number 748244
Logic IC Base Number 74244
Logic IC Function Scan Test Device with Octal Buffers
Operating Temperature Range 0°C to +70°C
Supply Voltage Range 4.5V to 5.5V
Termination Type Surface Mount Device
RoHS Compliant

Alternative Part Descriptions

  • LOGIC, SCAN TEST DEVICE BUFF, 24SOIC; Logic Type:Scan Test Device; Logic Case Style:SOIC; No. of Pins:24Pins; Supply Voltage Min:4.5V; Supply Voltage Max:5.5V; Operating Temperature Min:0°C; Operating Temperature Max:70°C; Product RoHS Compliant: Yes | Newark Electronics
  • IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal Buffers | Texas Instruments

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